光源類型

Light type

氙燈穩態光源

Xenon Lamp

冷卻方式(shì)

Cooling

定制風冷

Forced air cooling

光源壽命

Light source lifetime

＞1000h

＞1000h

光譜範圍

Spectrum wavelength

300-1200nm

300-1200nm

光源等級

Classfication of light source

光譜匹配度  0.875-1.125 A+

輻照度不均勻度  ≤1% A+

輻照度不穩定度  ≤1% A+

Spectral match is 0.875-1.125 , class   A+

Irradiance non-uniformity is ≤1%,  class   A+

Irradiance instability is ≤1% ,  class   A+

輻照度範圍

Irradiance intensity

200W/㎡~1200W/㎡

200W/㎡~1200W/㎡

測試面積

Illumination area

 1200*600mm

 2600*1400mm 可(kě)定制其他尺寸

 1200*600mm

 2600*1400mm Other size can be customized

測試模(mó)式(shì)  

Test mode

穩態測試模(mó)式(shì)可(kě)自由設定由1s到連續照光

Under steady-state mode, it can be set freely from 1s to continuous illumination. Besides

多通道設計(jì)

Multi-channel testing design

可(kě)實(shí)現36通道同(tóng)時測試 ，通道數量可(kě)定制

36 channels can be tested simultaneously , and the number of channels can be customized

測試技術

Testing technology

標(biāo)配I-V、V-I掃描(miáo)方式(shì) ，具備MPPT（最大功率點追蹤） 、I-t（定電壓(yā)）等多種測試技術 ，可(kě)通過(guò)軟(ruǎn)件切換，同(tóng)時集成(chéng)逐點掃描(miáo)方式(shì)（滿足最短≤0.2s步進的掃描(miáo)方式(shì)）

It equipped with I-V , V-I scanning , MPPT (maximum power point tracking), I-t (constant voltage) and other test technologies , all these technologies can be switched by software.  It also equipped point-by-point scanning ( meet the shortest scanning in step of ≤0.2s

測試電池(chí)

Measurable cell type

多晶 、單晶 、Topcon、BC、異(yì)質結(jié) 、CIGS、GaAs、CdTe 、鈣鈦礦 、鈣鈦礦疊層等

Poly-crystalline , Mono-crystalline , TopCon, HJT , BC ,CIGS , GaAs , CdTe and Perovskite

可(kě)增配項(xiàng)

Optional service

 集成(chéng)溫(wēn)控(kòng)系統 ，實(shí)現溫(wēn)度系數測試

 集成(chéng)EL測試系統 ，實(shí)現同(tóng)工位(wèi)IV/EL測試

 集成(chéng)IR紅外熱像儀(yí)，實(shí)現熱斑測試

 Temperature Chamber can be integrated

   to achieve measurement of temperature

   coefficient

 EL testing system can achieve IV and EL

   testing at a same production section

 Integrated with IR infrared thermal imager

   to realize heat spot testing